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Proceedings Paper

Rock fracture image acquisition with both visible and ultraviolet illuminations
Author(s): Weixing Wang; Eva Hakami
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Paper Abstract

Swedish Nuclear Fuel and Waste Management Company (SKB) have identified the need for a better understanding of radionuclide transport and retention processes in fractured rock since 1994. In the study, the first hard problem is to obtain rock fracture images of a good quality, since rock surface is very rough, and composed of complicated and multiple fractures, as a result, image acquisition is the first important. As a cooperation project between Sweden and China, we sampled a number of rock specimens for analyzing rock fracture network by visible and ultraviolet image technique, in the field. The samples are resin injected, in which way; opened fractures can be seen clearly by means of UV light illumination, and the rock surface information can be obtained by using visible optical illumination. We used different digital cameras and microscope to take images by two illuminations. From the same samples; we found that UV illumination image gives the clear information of fracture opening or closing, and the visible optical illumination gives the information of the rock surface (e.g. filling materials inside of fractures). By applying this technique, the minimum width of rock fracture 0.01 mm can be analyzed. This paper presents: (1) Rock fracture image acquiring techniques; (2) Rock fracture image acquisition by using UV light illumination and visible optical illumination; and (3) Conclusions. The studied method can be used both in the field and a laboratory.

Paper Details

Date Published: 19 May 2006
PDF: 6 pages
Proc. SPIE 6150, 2nd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment, 615014 (19 May 2006); doi: 10.1117/12.676716
Show Author Affiliations
Weixing Wang, Chongqing Univ. of Posts and Telecommunications (China)
ITASCA Geomekanik AB (Sweden)
Eva Hakami, ITASCA Geomekanik AB (Sweden)


Published in SPIE Proceedings Vol. 6150:
2nd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment
Xun Hou; Jiahu Yuan; James C. Wyant; Hexin Wang; Sen Han, Editor(s)

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