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Proceedings Paper

A new wavefront measuring method of laser beam traversing a supersonic flow by using Hartmann-Shack wavefront sensor
Author(s): Xiang Zhang; Chunhong Wang; Hao Xian; Jian Liu
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Paper Abstract

An innovative experimental method for studying the influence of supersonic flow on laser beam transmitting has been proposed. The wavefront phase properties and the dynamic wavefront change of laser beam traversing supersonic flow can be detected by Hartmann-Shack (H-S) wavefront sensor. Beam aberrations are constructed by adopting Zernike mode-reconstruction theory. The centroid change of laser beam and the far-field properties can be obtained by further analyzing the experimental data. In the paper, the experimental principle is presented, and wavefront aberrations with several different flow parameters are given. Some beam-quality criteria such as Zernike aberration coefficient, PV and RMS value, circle energy, Strehl ratio, and centroid change of beam, are also calculated. Experimental results show that the stage of flow establishing, stabilizing and ending can be detected by using H-S wavefront sensor. By comparing the result of no flow with that of a given-parameter flow, defocus and astigmatism aberration increase obviously. At the same time, the Strehl ratio is reduced and the beam quality is degraded. The same conclusion can be obtained by comparing no test-model with the given-structural test-mode in same flow. Moreover, the wavefront aberration of laser beam in the condition of different flow parameters can also be measured and compared accurately by using the test method.

Paper Details

Date Published: 23 February 2006
PDF: 10 pages
Proc. SPIE 6150, 2nd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment, 61504N (23 February 2006); doi: 10.1117/12.676658
Show Author Affiliations
Xiang Zhang, Institute of Optics and Electronics (China)
Chinese Academy of Sciences (China)
Chunhong Wang, Institute of Optics and Electronics (China)
Hao Xian, Institute of Optics and Electronics (China)
Jian Liu, Institute of Optics and Electronics (China)
Chinese Academy of Sciences (China)


Published in SPIE Proceedings Vol. 6150:
2nd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment
Xun Hou; Jiahu Yuan; James C. Wyant; Hexin Wang; Sen Han, Editor(s)

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