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Proceedings Paper

Image-based nanocrystallography with online database support
Author(s): Peter Moeck; Ján Zahornadský; Boris Dušek; Philip Fraundorf
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Paper Abstract

The crystallographic phase and morphology of many materials change with the crystal size so that new needs arise to determine the crystallography of nanocrystals. Direct space high-resolution phase-contrast transmission electron microscopy (HRTEM) and atomic resolution scanning TEM (STEM) when combined with tools for image-based nanocrystallography in two (2D) and three (3D) dimensions possess the capacity to meet these needs. After a concise discussion of lattice-fringe visibility spheres and maps, this paper discusses lattice-fringe fingerprinting in 2D and tilt protocol applications. On-line database developments at Portland State University (PSU) that support image-based nanocrystallography are also mentioned.

Paper Details

Date Published: 31 October 2006
PDF: 12 pages
Proc. SPIE 6370, Nanomaterial Synthesis and Integration for Sensors, Electronics, Photonics, and Electro-Optics, 63701A (31 October 2006); doi: 10.1117/12.676656
Show Author Affiliations
Peter Moeck, Portland State Univ. (United States)
Oregon Nanoscience and Microtechnologies Institute (United States)
Ján Zahornadský, Portland State Univ. (United States)
Charles Univ. of Prague (Czech Republic)
Boris Dušek, Portland State Univ. (United States)
Charles Univ. of Prague (Czech Republic)
Philip Fraundorf, Univ. of Missouri, St. Louis (United States)


Published in SPIE Proceedings Vol. 6370:
Nanomaterial Synthesis and Integration for Sensors, Electronics, Photonics, and Electro-Optics
Nibir K. Dhar; Achyut K. Dutta; M. Saif Islam, Editor(s)

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