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Proceedings Paper

Study on strain and temperature sensing characteristic of sampled fiber grating
Author(s): Dan-dan Zhu; Jian-jun Wang; Shu-xin Qiao; Zhong-chao Li; Zhi-quan Li
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Paper Abstract

Sampled fiber Bragg grating (SFBG) has caused extensive research interest due to its special filtering characteristic, strict wavelength interval, compact structure, easy integration, and low cost etc. Based on coupling-mode theory, the reflective spectrum of sampled fiber Bragg grating is analyzed using transmission matrix method. Strain and temperature sensing characteristics of sampled fiber Bragg grating are discussed in the paper. Wavelength shift and transmission intensity vary linearly with strain and temperature. Strain and temperature changes can be determined simultaneously by a single sampled fiber grating. In the experiment, the strain and temperature of sampled fiber Bragg grating change simultaneously, the photoelastic coefficients of sampled fiber Bragg grating are P11=0.121, P12=0.27. The Poisson ratio of optical fiber core stuff is 0.17, the thermal expansion coefficient is 5.5×10-7/°C,and the calorescence coefficient of optical fiber is 8.3×10-6/°C. By calculation, we have got that A, B, C and D separately -0.00276, 0.045, 0.72, 11.3, remain in the strain measuring range from 0 to 1200με, and the temperature measuring range from 20 to 110°C.

Paper Details

Date Published: 23 February 2006
PDF: 5 pages
Proc. SPIE 6150, 2nd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment, 61504D (23 February 2006); doi: 10.1117/12.676653
Show Author Affiliations
Dan-dan Zhu, Yanshan Univ. (China)
Jian-jun Wang, Yanshan Univ. (China)
Shu-xin Qiao, Yanshan Univ. (China)
Zhong-chao Li, Yanshan Univ. (China)
Zhi-quan Li, Yanshan Univ. (China)


Published in SPIE Proceedings Vol. 6150:
2nd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment
Xun Hou; Jiahu Yuan; James C. Wyant; Hexin Wang; Sen Han, Editor(s)

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