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Proceedings Paper

Approximate model of clear-sky radiance distribution
Author(s): ChunPing Yang; Jian Wu; Rong Qiu; XiaoDong Wang; Miao Liu; Jie Leng
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Paper Abstract

Sky radiance distribution is very important in theoretical study and application of the remote sensing. In this paper, an approximate sky radiance model is developed based on radiation transfer equation. The radiatiance observed from a point at the earth surface is divided into three parts, which is from single scattering, multiple scattering and related part with the earth surface. The single scattering and double scattering radiance is exactly calculated. All orders of multi-scattering beyond double scattering transfer were derived by a ratio of successive terms. Because of decreasing of sky radiance with increasing order, evaluating the sky radiance will stop when the effect on sky radiance of a given order multiple scattering is 5% less than the 1th multi-scattering magnitude. The interaction between the earth surface and scattering radiance is incorporated also. Comparisons of this model with a numerical code discrete coordinate method (DISORT) are made.

Paper Details

Date Published: 23 February 2006
PDF: 6 pages
Proc. SPIE 6150, 2nd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment, 61504J (23 February 2006); doi: 10.1117/12.676652
Show Author Affiliations
ChunPing Yang, Univ. of Electronic Science and Technology of China (China)
Jian Wu, Univ. of Electronic Science and Technology of China (China)
Rong Qiu, Univ. of Electronic Science and Technology of China (China)
XiaoDong Wang, Univ. of Electronic Science and Technology of China (China)
Miao Liu, Univ. of Electronic Science and Technology of China (China)
Jie Leng, Institute of Applied Electronics, CAEP (China)


Published in SPIE Proceedings Vol. 6150:
2nd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment
Xun Hou; Jiahu Yuan; James C. Wyant; Hexin Wang; Sen Han, Editor(s)

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