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Proceedings Paper

A full-vectorial FDFD analysis of photonic crystal fibers
Author(s): Wenwen Gu; Jianlin Zhao; Li Cui; Jianping Hou
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Paper Abstract

A full-vectorial finite-difference frequency domain (FDFD) method is used to analyze the photonic bandgaps and the mode fields of photonic crystal fibers (PCFs) with different structures. As a new kind of developed fibers with many particular and useful characteristics, PCFs have recently attracted a great deal of interest both in theory and experiments, and many modeling techniques have been applied to describe their characteristics. It has been proved that the full-vectorial FDFD method can achieve an accurate and stable analysis on the fantastic features of the PCF, by which the photonic bandgaps and the mode fields can be simply calculated first. The bandgap scan map of the triangular structure with the change of holes diameters has been proposed. And the bandgap maps of the 2D triangular lattice with and without defects are compared, too. Furthermore, the numerical results for 2D TE modes in the two dimensional triangular lattice with defects have been presented, where the air holes are circle and hexagon, respectively. The latter structure brought forward by us proves to be fit for the gas sensors. Based on the photonic bandgaps and the mode fields of the PCF, several other useful features can be calculated for the later analysis of the fibers.

Paper Details

Date Published: 19 May 2006
PDF: 7 pages
Proc. SPIE 6150, 2nd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment, 61500T (19 May 2006); doi: 10.1117/12.676649
Show Author Affiliations
Wenwen Gu, Northwestern Polytechnical Univ. (China)
Jianlin Zhao, Northwestern Polytechnical Univ. (China)
Li Cui, Northwestern Polytechnical Univ. (China)
Jianping Hou, Northwestern Polytechnical Univ. (China)


Published in SPIE Proceedings Vol. 6150:
2nd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment
Xun Hou; Jiahu Yuan; James C. Wyant; Hexin Wang; Sen Han, Editor(s)

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