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Proceedings Paper

Study of laser-induced fluorescence detection for capillary electrophoresis chip based on optical fiber coupled
Author(s): Weiping Yan; Xiaomin Mu; Ping Yan; Haijun Chen
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Paper Abstract

Laser-induced fluorescence (LIF) detection is widely utilized in micro capillary electrophoresis (CE) chip due to its high sensitivity and compatibility. However, the routine LIF detection brings some difficulties in microminiaturization and integration of micro-CE chip. For this reason, a simple and easy-to-use integrated laser-induced fluorescence detector for microchip was constructed and evaluated. A micro-CE chip with embedded optical fibers is designed and fabricated for on-line detection. A 532 nm laser was used as the excitation source, and the collimation and collection optics and mirrors were discarded by using a multimode optical fiber. The photon counter was used for the induced fluorescence detection. This structure avoids the requirement for complicated optical alignment procedures and equipment. The experimental results demonstrate that various samples can be successfully injected and detected by coupling excitation source with induced fluorescence by using the optical fiber. The fabrication of the chip and the experiments are carried out. The results showed that it is possible to develop a simple and flexible integrated detection system without using a series of mirrors of collection optics.

Paper Details

Date Published: 23 February 2006
PDF: 6 pages
Proc. SPIE 6150, 2nd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment, 615045 (23 February 2006); doi: 10.1117/12.676529
Show Author Affiliations
Weiping Yan, Dalian Univ. of Technology (China)
Xiaomin Mu, Dalian Univ. of Technology (China)
Ping Yan, Dalian Medical Univ. (China)
Haijun Chen, Dalian Medical Univ. (China)


Published in SPIE Proceedings Vol. 6150:
2nd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment
Xun Hou; Jiahu Yuan; James C. Wyant; Hexin Wang; Sen Han, Editor(s)

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