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Proceedings Paper

Highly accurate calibration of optical radiation at infrared spectrum using thermopile TS-76
Author(s): Lei Zhang; Xiao-bing Zheng; Ji Wang; Ping Xie; Feng Chen; Shuang Li; Wei Zhang
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Paper Abstract

Infrared radiometric calibration is of critical importance for information quantification of satellite remote sensing of environment at infrared spectrum. In this paper, thin-film thermopile sensors (IPHT-Jena, type TS-76) are used as transfer detectors in the spectral range from 514nm to 1550nm. The relative uncertainty in the spectral responsivity of the thin-film thermopiles was about 1.5%. Further work will be focused on calibrating TS-76 with a monochromator to extend the spectral range from 1800nm to 3000nm and reducing uncertainty budget of TS-76.

Paper Details

Date Published: 23 February 2006
PDF: 5 pages
Proc. SPIE 6150, 2nd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment, 615041 (23 February 2006); doi: 10.1117/12.676519
Show Author Affiliations
Lei Zhang, Anhui Institute of Optics and Fine Mechanics (China)
Xiao-bing Zheng, Anhui Institute of Optics and Fine Mechanics (China)
Ji Wang, Anhui Institute of Optics and Fine Mechanics (China)
Ping Xie, Anhui Institute of Optics and Fine Mechanics (China)
Feng Chen, Anhui Institute of Optics and Fine Mechanics (China)
Shuang Li, Anhui Institute of Optics and Fine Mechanics (China)
Wei Zhang, Anhui Institute of Optics and Fine Mechanics (China)


Published in SPIE Proceedings Vol. 6150:
2nd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment
Xun Hou; Jiahu Yuan; James C. Wyant; Hexin Wang; Sen Han, Editor(s)

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