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Proceedings Paper

An optical diagnosis system for in-situ observing and estimating crystal growth situation
Author(s): Ya Chen; Shuiyuan Tang; Qun Hao; Zhi Li
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Paper Abstract

An optical diagnosis and analysis system is developed to in-situ observe and estimate crystal growth situation. A polarizing filter and a high pass binary amplitude filter are used in a common microscopy to observe the phase object and also to inverse the image contrast and strengthen the image edge. Meanwhile, a series of image processing techniques, such as median filtering, Robert operator, optimal threshold method and so on, are introduced to analyze the images of the crystal. An improved Hough transformation is carried out to get the pattern of crystal lattice. Finally, according to the integrity of crystal lattice and the evenness in the crystal lattice, some advice on the crystal growth situation is given. Experimental results with the acquired images demonstrate that the proposed system is feasible.

Paper Details

Date Published: 23 February 2006
PDF: 5 pages
Proc. SPIE 6150, 2nd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment, 61503Y (23 February 2006); doi: 10.1117/12.676514
Show Author Affiliations
Ya Chen, Beijing Institute of Technology (China)
Shuiyuan Tang, Beijing Institute of Technology (China)
Qun Hao, Beijing Institute of Technology (China)
Zhi Li, Beijing Institute of Technology (China)


Published in SPIE Proceedings Vol. 6150:
2nd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment

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