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Proceedings Paper

Optimum design of uncooled staring infrared camera
Author(s): Yingwen Li; Debin Pan; Aidong Liu; Anbing Geng; Yong Li; Jun He
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Paper Abstract

Several models of target acquisition range prediction of the uncooled staring camera and their advantages are proposed in the paper. NVTherm is used to evaluate the modulation transfer function, minimum resolvable temperature difference and target acquisition range. The analysis result shows that the performance of the detector is the key factor to limit the performance of the uncooled staring camera. The target acquisition range of the uncooled infrared camera can be improved by increasing effective focus length (EFL) of optical component, decreasing its F/# or reducing the pixel pitch of the detector. The detection range of 1.09 km can be achieved under the condition of 75 mm EFL and F/0.8. When the EFL changes from 75mm to 150 mm under the condition of F/0.8 and 45μm pixel pitch, the detection range of 2.36 km, recognition range of 0.47 km and identification range of 0.24 km have been gotten. When the pixel pitch is reduced to 35μm, the detection range is 2.59 km. Furthermore, when 2 x 2 microscan is adopted in the camera design, then the pixel pitch will change from 35μm to 17.5μm. Although the infrared camera becomes an optical performance limited system, its performance improves a lot to get the detection range of 2.94 km. The field test shows that the detection range to a 1.7 m x 0.45 m target is 2.2 km under the condition of F/0.8, 150mm EFL and 45 μm pixel pitch, achieving good matches with the evaluation value of 2.36 km through NVTherm. An optimum uncooled infrared design is achieved using the NVTherm software which shortens the design cycle.

Paper Details

Date Published: 19 May 2006
PDF: 5 pages
Proc. SPIE 6150, 2nd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment, 61501A (19 May 2006); doi: 10.1117/12.676505
Show Author Affiliations
Yingwen Li, Huazong Institute of Electro-Optics (China)
Debin Pan, W.J.H. International Trading Inc. (United States)
Aidong Liu, W.J.H. International Trading Inc. (United States)
Anbing Geng, W.J.H. International Trading Inc. (United States)
Yong Li, W.J.H. International Trading Inc. (United States)
Jun He, W.J.H. International Trading Inc. (United States)


Published in SPIE Proceedings Vol. 6150:
2nd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment
Xun Hou; Jiahu Yuan; James C. Wyant; Hexin Wang; Sen Han, Editor(s)

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