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Proceedings Paper

Research of automatic test technology of parameters used in a dual-CCD TV measure-system
Author(s): Jian Zhao; Lirong Wang; Yingzhi Li
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Paper Abstract

This paper describes a kind of automatic test technology of the parameters used in a dual-CCD TV measure-system (TV-MS) .The TV-MS is the ground control equipment of the anti-tank missile and integrates the technologies of optical, machine and electronics. It is important and key component. The main technical parameters of the TV-MS are field of view, zero point, precision, sensitivity, anti-jamming ability, zooming time and focus time, etc. To insure the TV-MS satisfying the tactical and technical requirements and discover fault and reason, a fast and accurate equipment satisfying the test technical parameters of the TV-MS is urgently needed in manufacture and service. Firstly, the parameter test system converted optical signal to electronic signal, implemented automatic control of the invariant illumination of parallel pipeline output. Secondly, data and command delivering, displaying or printing are realized by using 80C196KB. The experiment result shows that the approach of automatic testing of the Parameters used in a dual-CCD TV-MS is successful and it can be used for all tests of the functions and parameters of the TV-MS. The main innovations are to realize the fast, veracious measure of technical parameters of the dual-CCD TV-MS, and integrate the technologies of optics, machineries and electronics. An advanced means is provided to judge the technical states, find malfunctions and discover the reasons in producing and maintaining process. The equipment suited for anti-tank missile systems is given.

Paper Details

Date Published: 23 February 2006
PDF: 7 pages
Proc. SPIE 6150, 2nd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment, 61503T (23 February 2006); doi: 10.1117/12.676502
Show Author Affiliations
Jian Zhao, Changchun Institute of Optics, Fine Mechanics and Physics (China)
Lirong Wang, Changchun Univ. (China)
Yingzhi Li, Changchun Institute of Optics, Fine Mechanics and Physics (China)


Published in SPIE Proceedings Vol. 6150:
2nd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment

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