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Proceedings Paper

Local frequency and phase analysis of interferogram
Author(s): Huiping Zeng; Jingang Zhong
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Paper Abstract

This paper presents an approach to extract local frequency and phase of interferogram from the ridge of its wavelet transform simultaneously. The principle is introduced. A Morlet wavelet is adopted for the continuous wavelet transform of interferogram. A numerical simulation and an experimental example have shown to verify the validity of the method introduced above.

Paper Details

Date Published: 23 February 2006
PDF: 6 pages
Proc. SPIE 6150, 2nd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment, 61503S (23 February 2006); doi: 10.1117/12.676500
Show Author Affiliations
Huiping Zeng, Jinan Univ. (China)
Jingang Zhong, Jinan Univ. (China)


Published in SPIE Proceedings Vol. 6150:
2nd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment
Xun Hou; Jiahu Yuan; James C. Wyant; Hexin Wang; Sen Han, Editor(s)

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