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Proceedings Paper

Design of simulating and analyzing software to optical correlator
Author(s): Yong Zhang; GuangBin Feng; Rui Xue; YongZhong Wang
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Paper Abstract

Optical correlator technologies play the important role in image processing systems. However, building a set of optical correlation system in lab, such as Vander Lugt correlator (VLC) or Joint Transform Correlator (JTC), takes lots of time and the expensive price. Meanwhile, there are some key technologies to solve in building processing. As an adjuvant tool, the simulation for optical correlation system by computer becomes an important means in building course. The computer simulation can find out the possibly potential problem in building term and the different operating condition to analyze the different experimental results. The paper offers detail the simulating procedure for JTC and VLC. In simulating term, the joint power spectrum differential method to smooth down the zero-order diffraction spot in JTC and produce an optimizing method to subdivide the macro-pixel based on Lee encoding method in VLC. The comparison between simulating and experimental results proves the feasibility of these methods and shows the bright application field. In the end of paper, an applying sample of simulating software to identify fingerprint images is given.

Paper Details

Date Published: 23 February 2006
PDF: 6 pages
Proc. SPIE 6150, 2nd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment, 61503R (23 February 2006); doi: 10.1117/12.676499
Show Author Affiliations
Yong Zhang, Ordnance Technology Institute (China)
GuangBin Feng, Ordnance Technology Institute (China)
Rui Xue, Xian Optical Insturment Factory (China)
YongZhong Wang, Ordnance Engineering College (China)


Published in SPIE Proceedings Vol. 6150:
2nd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment
Xun Hou; Jiahu Yuan; James C. Wyant; Hexin Wang; Sen Han, Editor(s)

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