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Proceedings Paper

Study on field weed recognition in real-time
Author(s): Yong He; Jiazhi Pan; Yun Zhang
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Paper Abstract

This research aimed to identify weeds from crops in early stage in the field by using image-processing technology. As 3CCD images offer greater binary value difference between weed and crop section than ordinary digital images taken by common cameras. It has 3 channels (green, red, ir red), which takes a snap-photo of the same area, and the three images can be composed into one image, which facilitates the segmentation of different areas. In this research, MS3100 3CCD camera is used to get images of 6 kinds of weeds and crops. Part of these images contained more than 2 kinds of plants. The leaves' shapes, sizes and colors may be very similar or differs from each other greatly. Some are sword-shaped and some (are) round. Some are large as palm and some small as peanut. Some are little brown while other is blue or green. Different combinations are taken into consideration. By the application of image-processing toolkit in MATLAB, the different areas in the image can be segmented clearly. The texture of the images was also analyzed. The processing methods include operations, such as edge detection, erosion, dilation and other algorithms to process the edge vectors and textures. It is of great importance to segment, in real time, the different areas in digital images in field. When the technique is applied in precision farming, many energies and herbicides and many other materials can be saved. At present time large scale softwares as MATLAB on PC are also used, but the computation can be reduced and integrated into a small embedded system. The research results have shown that the application of this technique in agricultural engineering is feasible and of great economical value.

Paper Details

Date Published: 19 May 2006
PDF: 5 pages
Proc. SPIE 6150, 2nd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment, 615011 (19 May 2006); doi: 10.1117/12.676493
Show Author Affiliations
Yong He, Zhejiang Univ. (China)
Jiazhi Pan, Zhejiang Univ. (China)
Yun Zhang, Zhejiang Univ. (China)


Published in SPIE Proceedings Vol. 6150:
2nd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment
Xun Hou; Jiahu Yuan; James C. Wyant; Hexin Wang; Sen Han, Editor(s)

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