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Proceedings Paper

New method of two-photon multi-layer optical disc storage
Author(s): Bing Jiang; Zhaolong Shen; Jianwen Cai; Huohong Tang; Hui Xing; Wenhao Huang
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Paper Abstract

Multi-layer data storage based on nonlinear effect caused by two-photon absorption is an attractive approach in the field of mass data storage. A two-photon multi-layer optical disc storage system with disc rotation structure has been proposed. The multi-layer fluorescent disc used in this system consists of three layers. A transparent substrate (under layer) and a thin reflective layer (middle layer) are bonded together forming a kind of structure similar to DVD disc, which is necessary to servo the vertical and radial deviation. Two-photon bits are recorded in top layer. The storage system has two modules: servo module and confocal module. The former keeps following the vertical and radial deviations by means of focusing and tracking servo technologies used in current two-dimensional optical storage devices, so the system can be compatible with CD/DVD. According to the driving signal of actuators in servo pick-up, the confocal module can also follow the disc deviation in both recording and reading processes. The servo module has been finished and the result of preliminary experiment is presented. Using the actuator and the objective lens (NA 0.6) in SANYO pick-up, we successfully recorded and read three data layers in photobleaching material with a homemade femtosecond laser. The layer separation was 15μm and the transverse bit separation was 4 μm.

Paper Details

Date Published: 23 February 2006
PDF: 5 pages
Proc. SPIE 6150, 2nd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment, 61503Q (23 February 2006); doi: 10.1117/12.676491
Show Author Affiliations
Bing Jiang, Univ. of Science and Technology of China (China)
Zhaolong Shen, Univ. of Science and Technology of China (China)
Jianwen Cai, Univ. of Science and Technology of China (China)
Huohong Tang, Univ. of Science and Technology of China (China)
Hui Xing, Univ. of Science and Technology of China (China)
Wenhao Huang, Univ. of Science and Technology of China (China)


Published in SPIE Proceedings Vol. 6150:
2nd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment
Xun Hou; Jiahu Yuan; James C. Wyant; Hexin Wang; Sen Han, Editor(s)

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