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Proceedings Paper

Application of wavelet denoising to power spectral density analysis
Author(s): Wei Chen; Han-Min Yao; Fan Wu; Shi-bin Wu; Qiang Chen
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Paper Abstract

It is important to describe optical surfaces by means of quantitative measurements. The interferogram obtained by large aperture phase shifting interferometry can help better characterize surface features and provide sufficient description of surface structures. There are several factors affect the measurement results: the optics, electronics and the test environment. Wavelet transformation is an ideal tool to detect trends, discontinuities, and short periodicities on a surface. We have calculated the PSD in three different conditions by simulative analysis, including ideal condition, noise-interference condition and wavelet denosing condition. Comparing these data, we find that the PSD in wavelet denosing is the most similar to it in ideal condition.

Paper Details

Date Published: 23 February 2006
PDF: 5 pages
Proc. SPIE 6150, 2nd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment, 61503O (23 February 2006); doi: 10.1117/12.676487
Show Author Affiliations
Wei Chen, Institute of Optics and Electronics (China)
Chinese Academy of Sciences (China)
Han-Min Yao, Institute of Optics and Electronics (China)
Fan Wu, Institute of Optics and Electronics (China)
Shi-bin Wu, Institute of Optics and Electronics (China)
Qiang Chen, Institute of Optics and Electronics (China)


Published in SPIE Proceedings Vol. 6150:
2nd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment
Xun Hou; Jiahu Yuan; James C. Wyant; Hexin Wang; Sen Han, Editor(s)

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