Share Email Print
cover

Proceedings Paper

Effect of surface roughness on the measurement of high power laser with a cone-shaped cavity
Author(s): Lei Wang; Zhaojin Yang; Gaoping Li; Yanxi Liang
Format Member Price Non-Member Price
PDF $14.40 $18.00

Paper Abstract

Cone-shaped cavity is an effective method for measuring energy of high energy laser, where the effect absorption coefficient of the cavity is often thought to be equal to 1. But in actual, because of the limitation of surface roughness, backscatter laser will happen in the cavity, which will influence the effective absorption coefficient. The paper reported here discusses this question in detail. According to the reflection rule, which is deeply relied on the surface roughness, the distribution function of backscatter laser power density is deduced in the paper. Numerical calculation method is used to analyze the expression of backscatter laser profile and calculate the total backscatter laser energy loss. Ring shaped backscatter energy meter is designed to inspect the backscatter energy lose of a cone-shaped high energy meter and to prove the theory calculation results. Experiment result shows that backscatter laser energy is indeed a significant error source in high energy laser measurement, and by adding the backscatter energy loss into the main measurement result, the precision of high energy laser energy measurement will greatly be enhanced.

Paper Details

Date Published: 19 May 2006
PDF: 6 pages
Proc. SPIE 6150, 2nd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment, 615006 (19 May 2006); doi: 10.1117/12.676426
Show Author Affiliations
Lei Wang, Xi'an Institute of Applied Optics (China)
Zhaojin Yang, Xi'an Institute of Applied Optics (China)
Gaoping Li, Xi'an Institute of Applied Optics (China)
Yanxi Liang, Xi'an Institute of Applied Optics (China)


Published in SPIE Proceedings Vol. 6150:
2nd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment
Xun Hou; Jiahu Yuan; James C. Wyant; Hexin Wang; Sen Han, Editor(s)

© SPIE. Terms of Use
Back to Top