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Proceedings Paper

Digitalization measurement of structure parameters of optic low-pass filter
Author(s): Yunchuan Li; Bin Lin; Zhuangfei Wu; Liewei Zhu; Xiangqun Cao
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Paper Abstract

A digitalization measurement method of structure parameters of optical low-pass filter (OLPF) is presented in this paper. OLPF which comprises two or three crystal plates is adopted in front of the CCD to reduce aliasing in a digitized image. Transiting a triple plate OLPF, an object of the point-source light can separate into eight points which are imaged in CMOS array. The distance of point to point provides us with the information of thickness of each crystal plate. The accuracy of measurement is better than 0.15μm.

Paper Details

Date Published: 19 May 2006
PDF: 5 pages
Proc. SPIE 6150, 2nd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment, 61501G (19 May 2006); doi: 10.1117/12.676417
Show Author Affiliations
Yunchuan Li, Zhejiang Univ. (China)
Bin Lin, Zhejiang Univ. (China)
Zhuangfei Wu, Zhejiang Univ. (China)
Liewei Zhu, Zhejiang Univ. (China)
Xiangqun Cao, Zhejiang Univ. (China)


Published in SPIE Proceedings Vol. 6150:
2nd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment
Xun Hou; Jiahu Yuan; James C. Wyant; Hexin Wang; Sen Han, Editor(s)

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