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Proceedings Paper

Universal tool microscope remanufacture based on CCD
Author(s): Jian Kang; Zhongxiang Hu; Xunming Zhang; Jiaying Zhang
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Paper Abstract

To overcome the drawback of traditional universal tool microscopes, a remanufacturing scheme based on charge coupled devices (CCD) is proposed. In this paper, the remanufacturing of old tool microscopes is replaced gradually by CCD and grating ruler and the development of a novel measuring system designed to directly analyze image of the screw to be measured is discussed. For the analysis of image, such novel image processing methods as adaptive switching median (ASM) filter and edge detection based on the modified Sobel operator are designed. For the line detection algorithm, HOUGH transform also is used to measure the screw parameter. Experiments on screw images demonstrate that the scheme of remanufactured universal tool microscope is of feasibility and the proposed measurement is of validity.

Paper Details

Date Published: 19 May 2006
PDF: 7 pages
Proc. SPIE 6150, 2nd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment, 61501J (19 May 2006); doi: 10.1117/12.676411
Show Author Affiliations
Jian Kang, National Key Lab. for Remanufacturing (China)
Zhongxiang Hu, National Key Lab. for Remanufacturing (China)
Xunming Zhang, National Key Lab. for Remanufacturing (China)
Jiaying Zhang, National Key Lab. for Remanufacturing (China)


Published in SPIE Proceedings Vol. 6150:
2nd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment
Xun Hou; Jiahu Yuan; James C. Wyant; Hexin Wang; Sen Han, Editor(s)

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