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Proceedings Paper

Applications of dispersive white-light spectral interferometry in optics
Author(s): Petr Hlubina
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Paper Abstract

Various original applications of dispersive white-light spectral interferometry employing a low-resolution spectrometer and based on the equalization wavelength determinations are reviewed. First, the differential group refractive index dispersion or the chromatic dispersion of a dispersive sample of known thickness is measured determining the equalization wavelength as a function of the displacement of the interferometer mirror. Similarly, the effective thickness of a dispersive sample is determined measuring the mirror displacement as a function of the group refractive index of material. Second, the technique, which needs no phase retrieving procedure to be applied, is used to measure mirror distances and displacements when dispersion in a two-beam interferometer is known. Third, a technique of dispersive spectral interferometry is used for a slightly dispersive interferometer including the effect of thin films. The technique, which needs phase retrieving procedure to be applied in processing spectral interferograms resolved over a wide spectral range, is used to determine the spectral phase of thin films or the positions of the interferometer mirror.

Paper Details

Date Published: 20 April 2006
PDF: 11 pages
Proc. SPIE 6158, Lightmetry and Light and Optics in Biomedicine 2004, 615803 (20 April 2006); doi: 10.1117/12.675758
Show Author Affiliations
Petr Hlubina, Silesian Univ. at Opava (Czech Republic)


Published in SPIE Proceedings Vol. 6158:
Lightmetry and Light and Optics in Biomedicine 2004
Katarzyna Kolacz; Jacek Sochacki, Editor(s)

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