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Proceedings Paper

Characterization of optical waveguides with very different refractive-index contrasts
Author(s): František Ondráček; Miroslav Skalský; Jiři Čtyroký
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Paper Abstract

In this contribution we describe the similarities and especially the differences arising when typical methods for the characterization of optical channel waveguides are applied to waveguides fabricated in different substrates that strongly differ in the refractive-index contrast. Behavior of straight channel waveguides fabricated by i) ion-exchange technique K+ ↔ Na+ or Ag+ ↔ Na+ in borosilicate or Er doped silicate glasses, ii) Ti-diffusion into the LiNbO3 substrate, and iii) silicon-on-insulator technology will be compared. Fabry-Perot resonator method based on a highly coherent fine-tunable semiconductor laser using different types of end-fire coupling arrangements will be described. Measurements of basic parameters of the optical waveguides, e.g. optical field distribution, optical losses, group effective index and their spectral dependencies will be presented and their features typical for particular waveguide structures will be compared.

Paper Details

Date Published: 18 April 2006
PDF: 6 pages
Proc. SPIE 6180, Photonics, Devices, and Systems III, 618014 (18 April 2006); doi: 10.1117/12.675691
Show Author Affiliations
František Ondráček, Institute of Radio Engineering and Electronics (Czech Republic)
Czech Technical Univ. of Prague (Czech Republic)
Miroslav Skalský, Institute of Radio Engineering and Electronics (Czech Republic)
Jiři Čtyroký, Institute of Radio Engineering and Electronics (Czech Republic)


Published in SPIE Proceedings Vol. 6180:
Photonics, Devices, and Systems III
Pavel Tománek; Miroslav Hrabovský; Miroslav Miler; Dagmar Senderákova, Editor(s)

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