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Proceedings Paper

Influence of charged centers on transport characteristics of alternating current thin film electroluminescent devices
Author(s): Mustafa M. Abdalla Ahmed; Pavel Tománek
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Paper Abstract

Charged centers exist in the phosphor layer of common alternating current thin film electroluminescent devices. In this article, the electron scattering process by these centers is studied through phase shift analysis. The scattering rates in different cases are gained and compared with other important scattering processes. The electron transport process is simulated by means of the Monte Carlo method. Quantitative results about the influence of charged centers on electron kinetic energy are gained.

Paper Details

Date Published: 18 April 2006
PDF: 5 pages
Proc. SPIE 6180, Photonics, Devices, and Systems III, 61800B (18 April 2006); doi: 10.1117/12.675648
Show Author Affiliations
Mustafa M. Abdalla Ahmed, Brno Univ. of Technology (Czech Republic)
Pavel Tománek, Brno Univ. of Technology (Czech Republic)

Published in SPIE Proceedings Vol. 6180:
Photonics, Devices, and Systems III
Pavel Tománek; Miroslav Hrabovský; Miroslav Miler; Dagmar Senderákova, Editor(s)

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