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Proceedings Paper

Measurements of conductivity of thin metal films at microwave frequencies
Author(s): Tomasz Zychowicz; Jerzy Krupka
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Paper Abstract

TE011 mode cavity method is presented for the surface resistance and conductivity measurements of thin metal films deposited on dielectric substrates. Rigorous solutions of multilateral metal-dielectric resonator structure are given that allow to determine surface resistance and conductivity from measured Q-factors and resonant frequencies of the structure. Measurements of several thin films have been performed at frequencies 9 GHz and 17 GHz

Paper Details

Date Published: 26 April 2006
PDF: 8 pages
Proc. SPIE 6159, Photonics Applications in Astronomy, Communications, Industry, and High-Energy Physics Experiments IV, 61591X (26 April 2006); doi: 10.1117/12.675096
Show Author Affiliations
Tomasz Zychowicz, Politechnika Warszawska (Poland)
Jerzy Krupka, Politechnika Warszawska (Poland)


Published in SPIE Proceedings Vol. 6159:
Photonics Applications in Astronomy, Communications, Industry, and High-Energy Physics Experiments IV

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