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Proceedings Paper

Single pulse ultrafast dynamic ellipsometry
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Paper Abstract

Ellipsometry is a very useful optical technique to probe the complex index of refraction of a material. We perform dynamic ellipsometry using ultrafast lasers to probe the complex index dynamics during passage of compressional shock waves through materials of interest. When used to measure passage of a shock wave through dielectric materials, dynamic ellipsometry provides a direct measure of the equation of state (except temperature). In addition, the changes in complex index can be used to measure phase transformations and their kinetics. Using two CCD cameras and two Wollaston prisms, ellipsometric data at two incidence angles and two polarizations can be obtained simultaneously. Adding a spectrograph in front of each CCD camera and using chirped probe pulses and frequency domain interferometry provides a few hundred ps of ellipsometric data from a single shock event.

Paper Details

Date Published: 7 June 2006
PDF: 6 pages
Proc. SPIE 6261, High-Power Laser Ablation VI, 626105 (7 June 2006); doi: 10.1117/12.674782
Show Author Affiliations
David S. Moore, Los Alamos National Lab. (United States)
Cynthia A. Bolme, Los Alamos National Lab. (United States)
Shawn D. McGrane, Los Alamos National Lab. (United States)
David J. Funk, Los Alamos National Lab. (United States)


Published in SPIE Proceedings Vol. 6261:
High-Power Laser Ablation VI
Claude R. Phipps, Editor(s)

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