Share Email Print
cover

Proceedings Paper

Design and optimization of electronic speckle pattern interferometers to evaluate three-dimensional displacements
Author(s): Amalia Martínez; Juan Antonio Rayas; Raúl Cordero
Format Member Price Non-Member Price
PDF $14.40 $18.00

Paper Abstract

When it is carried out to perform a three dimensional evaluation of displacements and strains, it has been proposed some optical systems which uses three illumination beams or the use of three sensors. The different sensitivity vectors components associated to each illumination beam; let us permit to calculate the displacement in each direction by sensitivity matrix. In the present work, simple geometries of interferometers are discussed. It is showed the sensitivity components for each source in the case of optical set-up with three divergent illuminating beams, where we analysed the sources position that makes possible measure the u, v and w components with a maximum weight factor in each direction respecting to set-up total sensitivity. The sources position is one on x-axis, the second on y-axis and the third near to z-axis. From the theoretical predictions is proposed an interferometer which is based on the ESPI technique which has the sources configuration calculated. Experimental results of displacements are presented to an elastic surface when a rotated load is applied in the centre of the target.

Paper Details

Date Published: 10 February 2006
PDF: 9 pages
Proc. SPIE 6046, Fifth Symposium Optics in Industry, 60462I (10 February 2006); doi: 10.1117/12.674670
Show Author Affiliations
Amalia Martínez, Ctr. de Investigaciones en Óptica, A. C. (Mexico)
Juan Antonio Rayas, Ctr. de Investigaciones en Óptica, A. C. (Mexico)
Raúl Cordero, Pontificia Univ. Católica de Chile (Chile)


Published in SPIE Proceedings Vol. 6046:
Fifth Symposium Optics in Industry
Eric Rosas; Rocío Cardoso; Juan C. Bermudez; Oracio Barbosa-García, Editor(s)

© SPIE. Terms of Use
Back to Top