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Proceedings Paper

Simulating diffractions and chromatic effects in the microlens array in searching for extrasolar planets with SPHERE IFS
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Paper Abstract

Observations of extrasolar planets using Integral Field Spectroscopy (IFS), if coupled with an extreme Adaptive Optics system and analyzed with a Simultaneous Differential Imaging technique (SDI), are a powerful tool to detect and characterize extrasolar planets directly; they enhance the signal of the planet and, at the same time, reduces the impact of stellar light and consequently important noise sources like speckles. We developed a simulation code able to test the capabilities of this IFS-SDI technique for different kinds of planets and telescopes, modeling the atmospheric and instrumental noise sources, and the main results of this code have been presented in Ref.1. This code, although it takes into account many parameters and sources of noise, can still be improved, and in order to do it we studied in detail two aspects that have been neglected in the first version of the code: the not uniform illumination of the microlenses and the speckle undersampling. The results of these studies are presented here.

Paper Details

Date Published: 27 June 2006
PDF: 11 pages
Proc. SPIE 6269, Ground-based and Airborne Instrumentation for Astronomy, 626960 (27 June 2006); doi: 10.1117/12.674651
Show Author Affiliations
Alessandro Berton, Max-Planck-Institut für Astronomie (Germany)
Raffaele Gratton, INAF - Osservatorio Astronomico di Padova (Italy)
Jacopo Antichi, INAF - Osservatorio Astronomico di Padova (Italy)
Kjetil Dohlen, Lab. d'Astrophysique de Marseille (France)
Riccardo Claudi, INAF - Osservatorio Astronomico di Padova (Italy)
Markus Feldt, Max-Planck-Institut für Astronomie (Germany)
Thomas Henning, Max-Planck-Institut für Astronomie (Germany)
Jean-Luc Beuzit, Lab. d'Astrophysique de Grenoble (France)
Pascal Puget, Observatoire de Paris Meudon (France)


Published in SPIE Proceedings Vol. 6269:
Ground-based and Airborne Instrumentation for Astronomy
Ian S. McLean; Masanori Iye, Editor(s)

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