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Proceedings Paper

Silicon photodiode responsivity on the visible region
Author(s): Arturo Nogueira-Jiménez; Carlos J. Román-Moreno
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Paper Abstract

A new method to characterize silicon photodiodes in the visible range, 380 nm through 780 nm, is presented. This methods uses a constant spectral power source with a thermal stability of filament better than 1 K over 2 999 K, that is the operation temperature. The spectral source consists of tungsten halogen thermally stabilized light source and a monocromator with focal length of 50 cm and a diffraction grating of 150 grooves/mm. The source allows a reproducibility of 0.2 nm and 0.01 % on intensity. The test silicon photodioode's resposivity shows a maximum deviation of 1.25 % on the spectral range as compare to a similar silicon photodetector calibrated by Newport Co.

Paper Details

Date Published: 10 February 2006
PDF: 5 pages
Proc. SPIE 6046, Fifth Symposium Optics in Industry, 604624 (10 February 2006); doi: 10.1117/12.674616
Show Author Affiliations
Arturo Nogueira-Jiménez, Univ. Nacional Autónoma de México (Mexico)
Carlos J. Román-Moreno, Univ. Nacional Autónoma de México (Mexico)

Published in SPIE Proceedings Vol. 6046:
Fifth Symposium Optics in Industry
Eric Rosas; Rocío Cardoso; Juan C. Bermudez; Oracio Barbosa-García, Editor(s)

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