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Proceedings Paper

Wavelet-based laser-induced ultrasonic inspection in pipes
Author(s): Martín E. Baltazar-López; Steve Suh; Ravinder Chona; Christian P. Burger
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Paper Abstract

The feasibility of detecting localized defects in tubing using Wavelet based laser-induced ultrasonic-guided waves as an inspection method is examined. Ultrasonic guided waves initiated and propagating in hollow cylinders (pipes and/or tubes) are studied as an alternative, robust nondestructive in situ inspection method. Contrary to other traditional methods for pipe inspection, in which contact transducers (electromagnetic, piezoelectric) and/or coupling media (submersion liquids) are used, this method is characterized by its non-contact nature. This characteristic is particularly important in applications involving Nondestructive Evaluation (NDE) of materials because the signal being detected corresponds only to the induced wave. Cylindrical guided waves are generated using a Q-switched Nd:YAG laser and a Fiber Tip Interferometry (FTI) system is used to acquire the waves. Guided wave experimental techniques are developed for the measurement of phase velocities to determine elastic properties of the material and the location and geometry of flaws including inclusions, voids, and cracks in hollow cylinders. As compared to the traditional bulk wave methods, the use of guided waves offers several important potential advantages. Some of which includes better inspection efficiency, the applicability to in-situ tube inspection, and fewer evaluation fluctuations with increased reliability.

Paper Details

Date Published: 10 February 2006
PDF: 9 pages
Proc. SPIE 6046, Fifth Symposium Optics in Industry, 604616 (10 February 2006); doi: 10.1117/12.674482
Show Author Affiliations
Martín E. Baltazar-López, Ctr. Nacional de Investigación y Desarrollo Tecnológico (Mexico)
Steve Suh, Texas A&M Univ. (United States)
Ravinder Chona, Texas A&M Univ. (United States)
Christian P. Burger, Texas A&M Univ. (United States)

Published in SPIE Proceedings Vol. 6046:
Fifth Symposium Optics in Industry
Eric Rosas; Rocío Cardoso; Juan C. Bermudez; Oracio Barbosa-García, Editor(s)

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