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Proceedings Paper

Applications of photoluminescence with continuous and pulsed excitation
Author(s): A. E. Martínez-Cantón; M. García-Rocha; R. Ortega-Martínez; C. J. Román-Moreno; I. Hernández-Calderón
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Paper Abstract

Photoluminescence (PL) belongs to the group of non-destructive characterization techniques, which consists basically in causing to impact light in a region of the material under study. Then, the material absorbs part of the energy of the incident light and, as a consequence, emits light. This technique is widely employed in different areas of the Industry and Basic Research; for example, in Medicine, Chemistry, Biology, Physics and in several areas of Engineering. As excitation source it can be used lamps, lasers and even solar light. On the other hand, there are processes that can occur to extremely short time scales. In this case new techniques have been developed. Among them, we can mention Time Resolved Photoluminescence. In this technique ultra-short laser pulses are employed which have a temporal width from a few nanoseconds (x10-9 sec) until femtoseconds (x10-15 sec). The use of pulsed lasers has served for the development of new methods of investigation and technologies, as has been the case of Femto-Chemistry, new Surgery methods in Medicine, Micro- and Nano- machining of materials, etc. In our case, we utilize Photoluminescence and the Time Resolved Photoluminescence for the characterization of semiconductors materials that have potential applications in Optoelectronics.

Paper Details

Date Published: 10 February 2006
PDF: 6 pages
Proc. SPIE 6046, Fifth Symposium Optics in Industry, 604611 (10 February 2006); doi: 10.1117/12.674477
Show Author Affiliations
A. E. Martínez-Cantón, CINVESTAV-IPN (Mexico)
CCADET-UNAM (Mexico)
M. García-Rocha, CINVESTAV-IPN (Mexico)
R. Ortega-Martínez, CCADET-UNAM (Mexico)
C. J. Román-Moreno, CCADET-UNAM (Mexico)
I. Hernández-Calderón, CINVESTAV-IPN (Mexico)


Published in SPIE Proceedings Vol. 6046:
Fifth Symposium Optics in Industry
Eric Rosas; Rocío Cardoso; Juan C. Bermudez; Oracio Barbosa-García, Editor(s)

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