Share Email Print
cover

Proceedings Paper

Young's modulus determination of new polymeric materials using optical techniques
Author(s): R. Rodriguez-Vera; J. A. Rayas; Amalia Martinez; O. Rodriguez; I. G. Yañez
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

It is described an Electronic Speckle Pattern Interferometer (ESPI) used for Young's modulus measuring of a new PVC material. The technique considers the construction of a small tensile testing machine that is good enough to apply loads on the polymeric specimens. A dual-illumination ESPI system is built up to measure specimen in-plane micro-displacements under the tension loads. For Young's modulus measuring, strain is required and determined by the force per area unit. Since the specimens have irregular traversal section, the self-imaging or Talbot-projected fringe technique is implemented for determining such a transversal section all along the specimen. Experimental results by using these optical techniques are shown, as well as, the measure of a new polymer Young's modulus.

Paper Details

Date Published: 10 February 2006
PDF: 6 pages
Proc. SPIE 6046, Fifth Symposium Optics in Industry, 604610 (10 February 2006); doi: 10.1117/12.674476
Show Author Affiliations
R. Rodriguez-Vera, Ctr. de Investigaciones en Óptica, A. C. (Mexico)
J. A. Rayas, Ctr. de Investigaciones en Óptica, A. C. (Mexico)
Amalia Martinez, Ctr. de Investigaciones en Óptica, A. C. (Mexico)
O. Rodriguez, Ctr. de Investigación en Química Aplicada (Mexico)
I. G. Yañez, Ctr. de Investigación en Química Aplicada (Mexico)


Published in SPIE Proceedings Vol. 6046:
Fifth Symposium Optics in Industry
Eric Rosas; Rocío Cardoso; Juan C. Bermudez; Oracio Barbosa-García, Editor(s)

© SPIE. Terms of Use
Back to Top