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Proceedings Paper

Sensitive characteristics of cyanine dye J-aggregates in the film of silver chloride microcrystals
Author(s): Xiaowei Li; Jixian Zhang; Rongxiang Zhang; Xiaohui Zhao; Weidong Lai
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Paper Abstract

Microwave absorption and dielectric spectrum detection technology, with high time resolution (less than 1ns), was used for non-contact measurement of electron property in solid materials. In this paper, the photoelectron decay time-resolved spectra of free electrons in cubic AgCl emulsion sensitized by different concentrations of green-sensitive cyanine dye were measured by dielectric spectrum equipment. At the same time the absorption spectra were obtained by spectrophotometer. Experiments show that when the sensitive concentration is less than 0.02ml(5.0mg/ml)/40g emulsion, the dye J-aggregate is not formed on the surface of silver chloride microcrystals; The photoelectron decay is slower than that of pure cubic AgCl emulsion. when the sensitive concentration is more than 0.2ml (5.0mg/ml)/40g emulsion, the dye J-aggregate is formed on the surface of silver chloride microcrystals; compared to the M-state of dye, the maximal absorption peak of J-aggregate is shifted to longer wavelength about 50nm. The photoelectron decay is faster than that of pure cubic AgCl emulsion.

Paper Details

Date Published: 9 June 2006
PDF: 5 pages
Proc. SPIE 6149, 2nd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Advanced Optical Manufacturing Technologies, 61493J (9 June 2006); doi: 10.1117/12.674355
Show Author Affiliations
Xiaowei Li, Hebei Univ. (China)
Jixian Zhang, Hebei Univ. (China)
Rongxiang Zhang, Hebei Univ. (China)
Xiaohui Zhao, Hebei Univ. (China)
Weidong Lai, Hebei Univ. (China)


Published in SPIE Proceedings Vol. 6149:
2nd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Advanced Optical Manufacturing Technologies
Li Yang; Shangming Wen; Yaolong Chen; Ernst-Bernhard Kley, Editor(s)

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