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Proceedings Paper

Determination of optical constants and thickness of Nb2O5 optical films from normal incidence transmission spectra
Author(s): Limei Lin; Fachun Lai; Zhiago Huang; Yan Qu; Rongquan Gai
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Paper Abstract

The optical constants and thickness of Nb2O5 optical thin film deposited by a reactive magnetron sputtering technique have been retrieved by all measurement data of the normal incidence transmittance. A computer program written in FORTRAN for determining the refractive index, extinction coefficient and thickness of this film has been developed and tested on two examples. This method can also calculate the optical constants and thickness of the film with a thickness thinner than a quarter wavelength optical thickness. Moreover, the optical constants calculated by this method are more accurate than those calculated by the envelope method. We also suggest that this method should be able to apply to other optical films, such as TiO2, SiO2 and Ta2O5.

Paper Details

Date Published: 9 June 2006
PDF: 6 pages
Proc. SPIE 6149, 2nd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Advanced Optical Manufacturing Technologies, 614920 (9 June 2006); doi: 10.1117/12.674262
Show Author Affiliations
Limei Lin, Fujian Normal Univ. (China)
Fachun Lai, Fujian Normal Univ. (China)
Zhiago Huang, Fujian Normal Univ. (China)
Yan Qu, Fujian Normal Univ. (China)
Rongquan Gai, Fujian Normal Univ. (China)


Published in SPIE Proceedings Vol. 6149:
2nd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Advanced Optical Manufacturing Technologies
Li Yang; Shangming Wen; Yaolong Chen; Ernst-Bernhard Kley, Editor(s)

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