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Proceedings Paper

Optical properties of light-emitting porous silicon
Author(s): Fengcheng Teng; Shuxin Qiao; Yanan Cai; Zhiquan Li
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Paper Abstract

Fundamental optical constants of porous silicon, which refer to the effective refractive index neff, the extinction coefficient K, the real parts εer and imaginary parts εei of the effective dielectric functions, and the absorption coefficient α, are calculated using the effective medium theory named the Modified two-phase Maxell-Garnett and two-phase Bruggeman models separately in the range of 400-1000 nm. In the model, the microstructure of porous silicon is considered as a two-phase granulated compound medium with identical silicon inclusions, placed at random inside a homogenous air matrix. To do the calculation the calculated reflectance spectra from two models are fitted with experiments corresponding to samples with porosities of 39%, 45%, 51%, 59%, and 67% in order to determine the involved parameters in dielectric function called Wemple-DiDomenico oscillator of the remaining silicon. Best results of both models are obtained using spheroidal inclusions of 0.9 eccentricity. Effects of the wavelength of incident light and the porosity of porous silicon on these optical constants were studied systematically.

Paper Details

Date Published: 9 June 2006
PDF: 5 pages
Proc. SPIE 6149, 2nd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Advanced Optical Manufacturing Technologies, 61491K (9 June 2006); doi: 10.1117/12.674244
Show Author Affiliations
Fengcheng Teng, Yanshan Univ. (China)
Shuxin Qiao, Yanshan Univ. (China)
Yanan Cai, Yanshan Univ. (China)
Zhiquan Li, Yanshan Univ. (China)


Published in SPIE Proceedings Vol. 6149:
2nd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Advanced Optical Manufacturing Technologies
Li Yang; Shangming Wen; Yaolong Chen; Ernst-Bernhard Kley, Editor(s)

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