Share Email Print
cover

Proceedings Paper

Polarization analysis in a very high resolution telescope (VHRT)
Author(s): Ying Zhang; Lin Li; Yi-fan Huang; Jia-guo Liu
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

A Very High Resolution Telescope (VHRT) is designed as a space-to-earth remote sensor and the polarization effect in this VHRT is analyzed in this paper. First, the theory of polarization effect is reviewed. Second, the Jones arithmetic of polarization aberrations in VHRT is presented. Then, CODE V software is used to realize the polarization ray trace in this system and the results of the polarization effect analysis are obtained. The output information includes the plot of Modulation Transfer Function (MTF), the plot of Point Spread Function (PSF), pupil map, relative illumination, illumination, distortion and Strehl ratio. Finally, effective methods to control the polarization effect in an optical system are given. According to the results of analysis, we have drawn the following conclusions. Polarization effect in an optical system shouldn't be ignored to improve the imaging quality; with the incident angle as small as possible to control the polarization effect. Coating design must be considered carefully for the optical design.

Paper Details

Date Published: 9 June 2006
PDF: 5 pages
Proc. SPIE 6149, 2nd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Advanced Optical Manufacturing Technologies, 61490V (9 June 2006); doi: 10.1117/12.674218
Show Author Affiliations
Ying Zhang, Beijing Institute of Technology (China)
Lin Li, Beijing Institute of Technology (China)
Yi-fan Huang, Beijing Institute of Technology (China)
Jia-guo Liu, Beijing Institute of Technology (China)


Published in SPIE Proceedings Vol. 6149:
2nd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Advanced Optical Manufacturing Technologies
Li Yang; Shangming Wen; Yaolong Chen; Ernst-Bernhard Kley, Editor(s)

© SPIE. Terms of Use
Back to Top