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Proceedings Paper

Study on cooling control of APD in the single-photon detection system
Author(s): Jinyun Zhou; Wen-yan Pei; Wei-jiang Wang; Chang-jun Liao; Song-hao Liu
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Paper Abstract

The low temperature control system of single photon detection device avalanche photodiode (APD) is researched. Avalanche photodiode is used for photon detector with high sensitivity. In order to reduce dark current, its operating environmental temperature needs to be lowered by a semiconductor thermoelectricity cooling apparatus. In accordance with the peculiarity of single photon detection system and the technology of semiconductor thermoelectric Peltier cooling, an APD cooling control system is designed and produced by properly selecting components and using some necessary control circuits. The accuracy and the lowest temperature of this control system can amount to 0.1oC and -50oC, respectively. Above all, the low temperature can be adjusted successively.

Paper Details

Date Published: 9 June 2006
PDF: 6 pages
Proc. SPIE 6149, 2nd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Advanced Optical Manufacturing Technologies, 614909 (9 June 2006); doi: 10.1117/12.674196
Show Author Affiliations
Jinyun Zhou, Guangdong Univ. of Technology (China)
Wen-yan Pei, Guangdong Univ. of Technology (China)
Wei-jiang Wang, Guangdong Univ. of Technology (China)
Chang-jun Liao, South China Normal Univ. (China)
Song-hao Liu, South China Normal Univ. (China)


Published in SPIE Proceedings Vol. 6149:
2nd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Advanced Optical Manufacturing Technologies
Li Yang; Shangming Wen; Yaolong Chen; Ernst-Bernhard Kley, Editor(s)

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