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Proceedings Paper

Analysis for urban/rural albedo from MODIS over East China
Author(s): Guiling Wang; Weimei Jiang; Ming Wei; Jie Xu
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Paper Abstract

Studies of albedo over urban/rural surface are important to better understand the land surface process in the ABL(atmospheric boundary layer). Urban landscape is the most heterogeneous surface that strongly influences the structure and development of the ABL. In this paper, the directional hemispherical reflectance (black-sky albedo, BSA), the bihemispherical reflectance (white-sky albedo, WSA) and the actual albedo (blue-sky albedo, A) are retrieved from the MODIS BRDF/albedo product (MOD43B1) for three broadbands (0.3- 0.7μm, 0.7-5.0μm, 0.3-5.0μm) in the Changjiang Delta of China. Particular attention is directed to examine the difference of surface albedos over urban and rural areas. The seasonal and spatial variations are investigated. Validation has also been done against field observation and showed that the albedo from MODIS is less than the observed. Albedo in visible broadband (0.3-0.7μm) over urban area is larger than that over rural area, but is less in near infrared broadband (0.7-5.0μm). For the total short broadbrand, it is difficult to reach qualitative conclusion because of urban complexity. The correlations of albedos and NDVI are strongly influenced by the spectral band and land cover. They are positive for the visible and the total broadbands, but negative for the near infrared in same season.

Paper Details

Date Published: 19 May 2006
PDF: 12 pages
Proc. SPIE 6199, Remote Sensing and Space Technology for Multidisciplinary Research and Applications, 61990F (19 May 2006); doi: 10.1117/12.673664
Show Author Affiliations
Guiling Wang, Nanjing Univ. (China)
Weimei Jiang, Nanjing Univ. (China)
Ming Wei, Nanjing Univ. of Information Science and Technology (China)
Jie Xu, Nanjing Univ. of Information Science and Technology (China)

Published in SPIE Proceedings Vol. 6199:
Remote Sensing and Space Technology for Multidisciplinary Research and Applications
Qingxi Tong; Xiuwan Chen; Allen Huang; Wei Gao, Editor(s)

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