Share Email Print

Proceedings Paper

Investigation of new material combinations for hard x-ray telescope designs
Author(s): C. P. Jensen; K. K. Madsen; F. E. Christensen
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

The materials chosen for depth graded multilayer designs for hard x-ray telescopes (10 keV to 80 keV) have until now been focusing on W/Si, W/SiC, Pt/C, and Pt/SiC. These material combinations have been chosen because of good stability over time and low interface roughness, However both W and Pt have absorption edges in the interesting energy range from 70 - 80 keV. If looking at the optical constants Cu and Ni would be good alternative high-Z candidates since the k-absorption edges in Cu and Ni is below 10 keV. We have investigated both of these materials as the reflecting layer in combination with SiC as the spacer layer and give the performance in terms of roughness, minimum obtainable d-spacing and stability over time as deposited in our planar magnetron sputtering facility. Likewise we review the same properties of WC/SiC coatings which we have previously developed and which allow for very small d-spacings. The combination of WC/SiC or the well established W/SiC with the above mentioned Cu and Ni-containing multilayers in the same stack allows for novel telescope designs operating up to and above 100 keV without the absorption edge structure.

Paper Details

Date Published: 13 June 2006
PDF: 8 pages
Proc. SPIE 6266, Space Telescopes and Instrumentation II: Ultraviolet to Gamma Ray, 626612 (13 June 2006); doi: 10.1117/12.673180
Show Author Affiliations
C. P. Jensen, Danish National Space Ctr. (Denmark)
K. K. Madsen, Danish National Space Ctr. (Denmark)
F. E. Christensen, Danish National Space Ctr. (Denmark)

Published in SPIE Proceedings Vol. 6266:
Space Telescopes and Instrumentation II: Ultraviolet to Gamma Ray
Martin J. L. Turner; Günther Hasinger, Editor(s)

© SPIE. Terms of Use
Back to Top