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Proceedings Paper

SMART-MOS: a NIR imager-MOS for the ELT
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Paper Abstract

We are currently developing a conceptual design for a future ELT NIR large field of view imager-spectrograph, SMART-MOS, along with several science cases from which top level instrument requirements are being established. This project form part of the EU Framework 6 Joint Research Activity on Smart Focal Planes. The instrument will offer multiobject spectroscopy, which will include the long slit mode, and image over a field of view of 1 to 2 arcmin, with high multiplexing capability. The use of a simple AO ground layer correction is envisaged but the instrument will not work at the diffraction limit though. Multi slits are the base line for the field selector, even when multi-IFU type instrument might be considered at later stage. There are two possible operational concepts for SMART-MOS, each of which involving different technologies: MOEMS type devices or sliding bars. We describe in this contribution the science cases and discuss the most relevant requirements which will drive the development. Preliminary optical and mechanical concepts are also sketched which include details about the most relevant part of the instrument.

Paper Details

Date Published: 6 July 2006
PDF: 12 pages
Proc. SPIE 6273, Optomechanical Technologies for Astronomy, 62731S (6 July 2006); doi: 10.1117/12.671675
Show Author Affiliations
Francisco Garzón, Instituto de Astrofísica de Canarias (Spain)
Univ. de La Laguna (Spain)
Eli Atad-Ettedgui, UK Astronomy Technology Ctr., Royal Observatory (United Kingdom)
Peter Hammersley, Instituto de Astrofísica de Canarias (Spain)
David Henry, UK Astronomy Technology Ctr., Royal Observatory (United Kingdom)
Callum Norrie, UK Astronomy Technology Ctr., Royal Observatory (United Kingdom)
Pablo Redondo, Instituto de Astrofísica de Canarias (Spain)
Frederic Zamkotsian, Lab. d'Astrophysique de Marseille (France)

Published in SPIE Proceedings Vol. 6273:
Optomechanical Technologies for Astronomy
Eli Atad-Ettedgui; Joseph Antebi; Dietrich Lemke, Editor(s)

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