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Proceedings Paper

Astronomical mm and sub-mm observations with the Multi-Fourier Transform Interferometer in 2005 and 2006
Author(s): Izumi S. Ohta; Makoto Hattori; Jyun'ichi Takahashi; Yuji Chinone; Yuan Luo; Hiroshi Matsuo
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Paper Abstract

We propose an instrument by applying the aperture synthesis technique to the Martin & Puplett type Fourier Transform Spectrometer in millimeter and sub-millimeter waves. We call this equipment Multi-Fourier Transform interferometer (MuFT). MuFT realizes a wide band imaging, spectroscopy and polarimetry in millimeter and sub-millimeter waves. The direct detectors, eg. bolometer, SIS video detector, can be used as the focal plane detectors. These type of detectors have a great advantage in FIR band since they are free from the quantum limit of the noise which limits the sensitivity of the heterodyne detectors used in the usual interferometers. Further, the direct detectors are able to make a large format array contrary to the usual interferometers in which usage of array detector is practically difficult. Above three characteristics make one be possible to develop high sensitive super broad band FIR interferometer with wide field of view. Fundamentals of the MuFT with results of laboratory experiments and current status of astronomical observations with MuFT are summarized. We did test observation with this system in the winter 2005. We also report concerning the observational result in 2006.

Paper Details

Date Published: 6 July 2006
PDF: 10 pages
Proc. SPIE 6275, Millimeter and Submillimeter Detectors and Instrumentation for Astronomy III, 627520 (6 July 2006); doi: 10.1117/12.671095
Show Author Affiliations
Izumi S. Ohta, National Astronomical Observatory (Japan)
Makoto Hattori, Tohoku Univ. (Japan)
Jyun'ichi Takahashi, Tohoku Univ. (Japan)
Yuji Chinone, Tohoku Univ. (Japan)
Yuan Luo, Tohoku Univ. (Japan)
Hiroshi Matsuo, National Astronomical Observatory (Japan)

Published in SPIE Proceedings Vol. 6275:
Millimeter and Submillimeter Detectors and Instrumentation for Astronomy III
Jonas Zmuidzinas; Wayne S. Holland; Stafford Withington; William D. Duncan, Editor(s)

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