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Proceedings Paper

Corner cube model for internal metrology system of Space Interferometer Mission (SIM)
Author(s): Xu Wang; Robert Korechoff; Mike Heflin; Lisa Sievers
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Paper Abstract

A corner cube (CC) articulation model has been developed to evaluate the SIM internal metrology (IntMet) optical delay bias (with the accuracy of picometer) due to the component imperfections, such as vertex offset, reflection coating index error, dihedral error, and surface figure error at each facet. This physics-based and MATLAB-implemented geometric optics model provides useful guidance on the flight system design, integration, and characterization. The first portion of this paper covers the CC model details. Then several feature of the model, such as metrology beam footprint visualization, roofline straddling/crossing analysis, and application to drive the sub-system design and the error budget flow-down, are demonstrated in the second part.

Paper Details

Date Published: 28 June 2006
PDF: 10 pages
Proc. SPIE 6268, Advances in Stellar Interferometry, 62682P (28 June 2006); doi: 10.1117/12.670105
Show Author Affiliations
Xu Wang, Jet Propulsion Lab. (United States)
Robert Korechoff, Jet Propulsion Lab. (United States)
Mike Heflin, Jet Propulsion Lab. (United States)
Lisa Sievers, Jet Propulsion Lab. (United States)

Published in SPIE Proceedings Vol. 6268:
Advances in Stellar Interferometry
John D. Monnier; Markus Schöller; William C. Danchi, Editor(s)

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