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Proceedings Paper

A combined non-uniformity and bad pixel correction method for superpixelated infrared imagery
Author(s): Nicholas I. Rummelt; Todd Cicchi; J. P. Curzan
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Paper Abstract

With the recent introduction of infrared cameras that have the ability to produce variable acuity imagery, it has become necessary to develop methods for bad pixel replacement and non-uniformity correction within superpixels. Since a superpixel is formed by averaging a group of smaller pixels on chip prior to readout, producing a single value, we cannot apply gains and offsets to the individual pixels that contribute to the superpixel value, nor can we replace bad pixels within a superpixel before they corrupt the aggregate intensity of the superpixel. Without new superpixel correction methods, the imagery produced by this exciting technology is less appealing to human observers and corrupted superpixel intensities lead to problems with the algorithms that process the imagery to perform useful automated tasks, such as "hot-spot" tracking. This paper will introduce a method for performing the non-uniformity and bad pixel corrections in superpixels and demonstrate the performance.

Paper Details

Date Published: 17 May 2006
PDF: 8 pages
Proc. SPIE 6206, Infrared Technology and Applications XXXII, 62060V (17 May 2006); doi: 10.1117/12.669507
Show Author Affiliations
Nicholas I. Rummelt, Air Force Research Lab. (United States)
Todd Cicchi, Nova Sensors Inc (United States)
J. P. Curzan, Nova Sensors Inc (United States)


Published in SPIE Proceedings Vol. 6206:
Infrared Technology and Applications XXXII
Bjørn F. Andresen; Gabor F. Fulop; Paul R. Norton, Editor(s)

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