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Proceedings Paper

Resistor array waveband nonuniformity measurements and RNUC band converter
Author(s): R. Bryan Sisko; Rhoe A. Thompson; Steven A. Marlow; Breck A. Sieglinger
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Paper Abstract

The nonuniformity correction (NUC) of a resistor array is typically performed with a high-grade infrared (IR) camera in the approximate waveband of a sensor under test (SUT). The array emitter outputs, and therefore the response nonuniformity, are a complicated function of the spectral band. In this paper, we study the performance obtained when measuring and NUCing the projector in one spectral band, then using the projector for testing in a different band. This is a practical necessity, since a test facility typically cannot own cameras for NUCing a projector in the wavebands of all test articles. We show that some aspects of the NUC can be reliably 'converted' or adjusted from one spectral band to another. But there are several different mechanisms that contribute to the response nonuniformity, and their dependence on the spectral band is different. We present several studies showing the results of measuring the nonuniformity in one band, and operating the projector in a different band.

Paper Details

Date Published: 16 May 2006
PDF: 10 pages
Proc. SPIE 6208, Technologies for Synthetic Environments: Hardware-in-the-Loop Testing XI, 62080Y (16 May 2006); doi: 10.1117/12.669309
Show Author Affiliations
R. Bryan Sisko, Aegis Technologies Group, Inc. (United States)
Rhoe A. Thompson, Air Force Research Lab. (United States)
Steven A. Marlow, Consultant for MacAulay-Brown Inc. (United States)
Breck A. Sieglinger, Consultant for MacAulay-Brown Inc. (United States)


Published in SPIE Proceedings Vol. 6208:
Technologies for Synthetic Environments: Hardware-in-the-Loop Testing XI
Robert Lee Murrer, Editor(s)

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