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Proceedings Paper

Fast line-of-sight imagery for target and exhaust-plume signatures (FLITES) scene generation program
Author(s): Dennis Crow; Charles Coker; Wayne Keen
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Paper Abstract

The Fast Line-of-sight Imagery for Target and Exhaust Signatures (FLITES) is an advanced scene generation program capable of producing high-fidelity synthetic signatures for Infrared (IR) applications. The signature methodology provides physically traceable solutions to compute hardbody and plume radiation. An exact approach to render pixel-accurate scenes is provided to guarantee the pixel intensities are not aliased regardless of scene size, orientation, and range between the viewer and scene object. The FLITES program architecture has been developed to provide an Application Programming Interface (API) suitable to allow direct linking to higher-level simulations. This architecture also supports distributed processing to allow the program to be executed on processor clusters. The program is written in C++ and provisions have been included to allow the important signature routines such as bi-directional reflection and plume radiance transport to be replaced with alternate, application-specific, approaches if required. FLITES principle advancement has been in the area of plume signatures from three-dimensional (3D) plume flowfields. This capability allows complex flowfields to be rendered by FLITES that include helicopter plumes, staging transients, asymmetric turbulent flowfields, and exhaust plumes from airborne objects operating at an angle-of-attack relative to the ambient air stream.

Paper Details

Date Published: 16 May 2006
PDF: 8 pages
Proc. SPIE 6208, Technologies for Synthetic Environments: Hardware-in-the-Loop Testing XI, 62080J (16 May 2006); doi: 10.1117/12.669306
Show Author Affiliations
Dennis Crow, Kinetics, Inc. (United States)
Charles Coker, Air Force Research Lab. (United States)
Wayne Keen, SyColeman Corp. (United States)

Published in SPIE Proceedings Vol. 6208:
Technologies for Synthetic Environments: Hardware-in-the-Loop Testing XI
Robert Lee Murrer Jr., Editor(s)

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