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Proceedings Paper

Large format resistive array (LFRA) infrared scene projector (IRSP) performance and production status
Author(s): Jim Oleson; Jay James; Joe LaVeigne; Kevin Sparkman; Greg Matis; Steve McHugh; John Lannon; Scott Goodwin; Alan Huffman; Steve Solomon; Paul Bryant
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Paper Abstract

SBIR has completed development of the Large Format Resistive Array (LFRA) Infrared Scene Projector (IRSP) and shipped the first production system. Nine more systems are in production and will be shipped to several US Government customers on approximately six week centers. The commercial name of the LFRA IRSP is Mirage XL. System performance meets a broad range of program requirements and SBIR has been extremely successful in producing this ground breaking projector. Tests performed on System #1 reveal broad compliance to the specification and, in particular, outstanding emitter array performance. Key emitter requirements that have been met or exceeded include Operability, Maximum Apparent Temperature, and Array Uniformity. Key System specifications are: Large-format emitter array (1024x1024); High maximum apparent temperature (>700K); 200 Hz full-frame operation; 400 Hz static window mode (1024x512); Non Uniformity (uncorrected) <10%.

Paper Details

Date Published: 16 May 2006
PDF: 8 pages
Proc. SPIE 6208, Technologies for Synthetic Environments: Hardware-in-the-Loop Testing XI, 620810 (16 May 2006); doi: 10.1117/12.669301
Show Author Affiliations
Jim Oleson, Santa Barbara Infrared, Inc. (United States)
Jay James, Santa Barbara Infrared, Inc. (United States)
Joe LaVeigne, Santa Barbara Infrared, Inc. (United States)
Kevin Sparkman, Santa Barbara Infrared, Inc. (United States)
Greg Matis, Santa Barbara Infrared, Inc. (United States)
Steve McHugh, Santa Barbara Infrared, Inc. (United States)
John Lannon, RTI International (United States)
Scott Goodwin, RTI International (United States)
Alan Huffman, RTI International (United States)
Steve Solomon, Acumen Scientific (United States)
Paul Bryant, Left Coast Consulting (United States)


Published in SPIE Proceedings Vol. 6208:
Technologies for Synthetic Environments: Hardware-in-the-Loop Testing XI
Robert Lee Murrer, Editor(s)

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