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Proceedings Paper

Terahertz behavior of optical components and common materials
Author(s): Andrew J. Gatesman; Andriy Danylov; Thomas M. Goyette; Jason C. Dickinson; Robert H. Giles; William Goodhue; Jerry Waldman; William E. Nixon; Weber Hoen
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Paper Abstract

As short range, ground based, surveillance systems operating at terahertz frequencies continue to evolve, increasing attention is being directed towards the behavior of dielectric materials at terahertz frequencies as well as the behavior of optical components used to control terahertz radiation. This work provides an overview of several terahertz optical components such as frequency selective filters, laser output couplers, artificial dielectrics, and electromagnetic absorbers. In addition, a database was established that contains terahertz properties of common materials that have been largely unexplored in this region of the spectrum. The database consists of transmittance and reflectance spectra of a variety of materials measured using Fourier transform infrared spectroscopy techniques from 175 GHz - 2 THz. In addition, ultra-stable, CO2 optically pumped, far-infrared gas lasers were used to collect fixed-frequency transmittance data at 326 GHz, 584 GHz, and 1.04 THz. A Gunn oscillator was used for measurements at 94 GHz.

Paper Details

Date Published: 19 May 2006
PDF: 12 pages
Proc. SPIE 6212, Terahertz for Military and Security Applications IV, 62120E (19 May 2006); doi: 10.1117/12.668384
Show Author Affiliations
Andrew J. Gatesman, Univ. of Massachusetts Lowell (United States)
Andriy Danylov, Univ. of Massachusetts Lowell (United States)
Thomas M. Goyette, Univ. of Massachusetts Lowell (United States)
Jason C. Dickinson, Univ. of Massachusetts Lowell (United States)
Robert H. Giles, Univ. of Massachusetts Lowell (United States)
William Goodhue, Univ. of Massachusetts Lowell (United States)
Jerry Waldman, Univ. of Massachusetts Lowell (United States)
William E. Nixon, U.S. Army National Ground Intelligence Ctr. (United States)
Weber Hoen, Lincoln Lab., Massachusetts Institute of Technology (United States)


Published in SPIE Proceedings Vol. 6212:
Terahertz for Military and Security Applications IV
Dwight L. Woolard; R. Jennifer Hwu; Mark J. Rosker; James O. Jensen, Editor(s)

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