Share Email Print
cover

Proceedings Paper

Ronchi test with sub-structured gratings
Author(s): Yaoltzin Luna-Zayas; Fermín-Granados Agustín; Alejandro Cornejo-Rodríguez
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

The Ronchi test is a well-known method for the testing of optical components and systems, and can be studied by ray tracing and lateral shearing interferometry. In this paper, the Ronchi test is applied using an LCD, for generating gratings with different periods for the dark and light zones, in order to obtain sharpening of the fringes. Experimental and computer simulations will be presented for parabolic surfaces.

Paper Details

Date Published: 1 February 2006
PDF: 7 pages
Proc. SPIE 6034, ICO20: Optical Design and Fabrication, 60341W (1 February 2006); doi: 10.1117/12.668170
Show Author Affiliations
Yaoltzin Luna-Zayas, Instituto Nacional de Astrofísica, Óptica y Electrónica (Mexico)
Fermín-Granados Agustín, Instituto Nacional de Astrofísica, Óptica y Electrónica (Mexico)
Alejandro Cornejo-Rodríguez, Instituto Nacional de Astrofísica, Óptica y Electrónica (Mexico)


Published in SPIE Proceedings Vol. 6034:
ICO20: Optical Design and Fabrication
James Breckinridge; Yongtian Wang, Editor(s)

© SPIE. Terms of Use
Back to Top