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Proceedings Paper

Study on Fourier transforms profilometry based on bi-color projecting
Author(s): Wenjing Chen; Xianyu Su; Yiping Cao; Qiancan Zhang; Liqun Xiang
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Paper Abstract

We propose an improved FTP based on bi-color grating projecting. Two individual sinusoidal fringe patterns with π phase difference can be decoded from the deformed bi-color sinusoidal fringe pattern captured by color digital camera. Accessing the two fringe patterns, we can not only eliminate zero order spectra but also automatically build a binary mask at the same time to mark the valid measurement area easily, by which unwrapping phase time is shorten as well as phase error from invalid area is not transferred into valid area; Furthermore, we can easily expand the captured non-full-field deformed fringe pattern to form full field fringe pattern to guarantee frequency resolution.

Paper Details

Date Published: 20 January 2006
PDF: 6 pages
Proc. SPIE 6027, ICO20: Optical Information Processing, 60271J (20 January 2006); doi: 10.1117/12.668137
Show Author Affiliations
Wenjing Chen, Sichuan Univ. (China)
Xianyu Su, Sichuan Univ. (China)
Yiping Cao, Sichuan Univ. (China)
Qiancan Zhang, Sichuan Univ. (China)
Liqun Xiang, Sichuan Univ. (China)


Published in SPIE Proceedings Vol. 6027:
ICO20: Optical Information Processing

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