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Proceedings Paper

Micro electronic and macro optical parameters of the ITO films prepared by DC sputtering for electrochromic applications
Author(s): H. N. Cui; V. Teixeira; Li-Jian Meng; E. Fortunato
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Paper Abstract

The refractive index (n), the extinction coefficient (κ), dielectric constant ε, free carrier density (nc) and the carrier mobility (μ) of the ITO (Indium-Tin-Oxide) films with different deposition time (or thickness), oxygen partial pressure ratio (PO2) and annealing temperature were measured and studied. The calculated optical parameter-extinction coefficient (κ) was obtained from the diffuse reflectance spectra using "scattering model". The Lorentz oscillator classical model has also been used for fitting the ellipsometric spectra in order to obtain both n and κ values. As comparing the Swanepoel method was used for the refractive index. Clearly the results of the "scattering model", Swanepoel method and Ellipsometric method agree in magnitude. The films prepared at different PO2 show different behaviour of the refractive index and extinction coefficient. The electrical characteristic parameter nc and μ were compared and studied by experimental measurements and calculations using an equation that relates the dielectric function and photo-energy (Drude theory) by Mathematic-4.1 software. Both measured and calculated values coincide in magnitude.

Paper Details

Date Published: 1 February 2006
PDF: 9 pages
Proc. SPIE 6034, ICO20: Optical Design and Fabrication, 603407 (1 February 2006); doi: 10.1117/12.668090
Show Author Affiliations
H. N. Cui, Univ. of Minho (Portugal)
V. Teixeira, Univ. of Minho (Portugal)
Li-Jian Meng, Instituto Politécnico do Porto (Portugal)
E. Fortunato, Univ. Nova de Lisboa (Portugal)


Published in SPIE Proceedings Vol. 6034:
ICO20: Optical Design and Fabrication
James Breckinridge; Yongtian Wang, Editor(s)

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