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Proceedings Paper

A fast fourier transform algorithm for surface profiler based on scanning white-light interferometry
Author(s): Wendong Zou; Nan Du; Yanjun Fu; Huirong Xiao; Qiang Du
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Paper Abstract

In this paper, we introduce a fast Fourier transform algorithm for three-dimension surface analysis in a scanning white-light interferometry system. The interferograms, one for each pixel of the interference image, representing the variation in intensity as a function of scan position, are transformed into the spatial frequency domain and the relative surface height information for each point is extracted from the complex phase as a function of frequency. For optimal speed and efficiency with a minimum of resources, a simple frequency-based discriminator is used in data acquisition to identify the modulation region and a circular buffer technique is adopted for retaining the complete interferogram efficiently. Applying this method to the mapping of the endface topography of fiber connector, we've achieved high measurement repeatability and speed.

Paper Details

Date Published: 20 January 2006
PDF: 5 pages
Proc. SPIE 6027, ICO20: Optical Information Processing, 60270P (20 January 2006); doi: 10.1117/12.667904
Show Author Affiliations
Wendong Zou, Nanchang Institute of Aeronautical Technology (China)
Nan Du, Nanchang Institute of Aeronautical Technology (China)
Yanjun Fu, Nanchang Institute of Aeronautical Technology (China)
Huirong Xiao, Nanchang Institute of Aeronautical Technology (China)
Qiang Du, Nanchang Institute of Aeronautical Technology (China)


Published in SPIE Proceedings Vol. 6027:
ICO20: Optical Information Processing
Yunlong Sheng; Songlin Zhuang; Yimo Zhang, Editor(s)

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