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Proceedings Paper

Analysis of the throughput of onboard polarization interference imaging spectrometer
Author(s): Chunmin Zhang; Baochang Zhao; Yan Yuan; Jian He
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Paper Abstract

The mechanism of beam shearing splitting and principle of the interfering imaging of the self-developed onboard Polarization Interference Imaging Spectrometer (PIIS) were expounded in this paper. The throughput of PIIS is analyzed. The relation of the throughput with the angle of the polarized orientation of the polarizer to the ideal direction is derived. This Polarization Interference Imaging Spectrometer has the merit of simple structure, no moving parts, and high throughput. Because of its unique advantage of static, compact in size, wide field of view, it is applicable for the aviation, spaceflight, remote sensing, fieldwork or weak signal detection.

Paper Details

Date Published: 7 February 2006
PDF: 6 pages
Proc. SPIE 6032, ICO20: MEMS, MOEMS, and NEMS, 60320T (7 February 2006); doi: 10.1117/12.667886
Show Author Affiliations
Chunmin Zhang, Xi'an Jiaotong Univ. (China)
Xi'an Institute of Optics and Precision Mechanics (China)
Baochang Zhao, Xi'an Institute of Optics and Precision Mechanics (China)
Yan Yuan, Xi'an Institute of Optics and Precision Mechanics (China)
Jian He, Xi'an Jiaotong Univ. (China)


Published in SPIE Proceedings Vol. 6032:
ICO20: MEMS, MOEMS, and NEMS
Masayoshi Esashi; Zhaoying Zhou, Editor(s)

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